AUTOMATED STRUCTURE-FACTOR REFINEMENT FROM CONVERGENT-BEAM ELECTRON-DIFFRACTION PATTERNS

被引：43

作者：

ZUO, JM

机构：

来源：

ACTA CRYSTALLOGRAPHICA SECTION A | 1993年 / 49卷

关键词：

D O I：

10.1107/S010876739201095X

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

An improved algorithm is described for automated structure-factor refinement using convergent-beam electron diffraction patterns. In addition to refinement of structure factors, absorption coefficients and sample thickness, the new algorithm includes beam-direction refinement, the inclusion of weak-beam effects using the Bethe potential and the inclusion of finite-sized detector effects. The use of these new features is illustrated through the refinement of the MgO 200 systematic reflections.

引用

页码：429 / 435

页数：7

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