共 13 条
[1]
CHARACTERIZATION OF THIN-FILM ELECTROLUMINESCENT STRUCTURES BY SIMS AND OTHER ANALYTICAL TECHNIQUES
[J].
FRESENIUS ZEITSCHRIFT FUR ANALYTISCHE CHEMIE,
1985, 322 (02)
:175-180
[3]
BARROW WA, 1984, SID INT S, P249
[4]
KING CN, 1988, SID 88 DIGEST
[5]
Leskela M., 1988, Chemtronics, V3, P113
[6]
LESKELA M, 1989, ATOMIC LAYER EPITAXY, pCH2
[9]
TANAKA S, 1988, P SID, V29, P77
[10]
TANAKA S, 1985, P SID, V26, P255