CHARACTERIZATION OF THIN-FILM ELECTROLUMINESCENT STRUCTURES BY SIMS AND OTHER ANALYTICAL TECHNIQUES

被引：23

作者：

ANTSON, H

GRASSERBAUER, M

HAMILO, M

HILTUNEN, L

KOSKINEN, T

LESKELA, M

NIINISTO, L

STINGEDER, G

TAMMENMAA, M

机构：

[1] HELSINKI UNIV TECHNOL,DEPT CHEM,SF-02150 ESPOO,FINLAND

[2] VIENNA TECH UNIV,INST ANALYT CHEM,A-1060 VIENNA,AUSTRIA

[3] LOHJA CORP,DIV DISPLAY TECHNOL,SF-02200 ESPOO,FINLAND

来源：

FRESENIUS ZEITSCHRIFT FUR ANALYTISCHE CHEMIE | 1985年 / 322卷 / 02期

关键词：

D O I：

10.1007/BF00517656

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

引用

页码：175 / 180

页数：6

共 10 条

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[7] ZINC CHALCOGENIDE THIN-FILMS GROWN BY THE ATOMIC LAYER EPITAXY TECHNIQUE USING ZINC ACETATE AS SOURCE MATERIAL
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