CHARACTERIZATION OF MATERIALS BY SECONDARY ION MASS-SPECTROMETRY (SIMS) - NEW POSSIBILITIES OF TRACE, MICRO AND SURFACE-ANALYSIS

被引：14

作者：

GRASSERBAUER, M

STINGEDER, G

PIMMINGER, M

机构：

来源：

FRESENIUS ZEITSCHRIFT FUR ANALYTISCHE CHEMIE | 1983年 / 315卷 / 07期

关键词：

D O I：

10.1007/BF00487503

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

引用

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页码：575 / 590

页数：16

相关论文

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