STRUCTURAL-PROPERTIES OF A-SI AND A-SI-H BY EXAFS

被引：15

作者：

FILIPPONI, A ^{[1
]}

DELLASALA, D ^{[1
]}

EVANGELISTI, F ^{[1
]}

BALERNA, A ^{[1
]}

MOBILIO, S ^{[1
]}

机构：

[1] IST NAZL FIS NUCL, LAB NAZL FRASCATI, I-00044 FRASCATI, ITALY

来源：

JOURNAL DE PHYSIQUE | 1986年 / 47卷 / C-8期

关键词：

D O I：

10.1051/jphyscol:1986873

中图分类号：

学科分类号：

摘要：

引用

页码：375 / 377

页数：3

共 9 条

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[6] X-RAY-DIFFRACTION STUDY OF THE EFFECT OF HYDROGEN-ATOMS ON THE SI-SI ATOMIC SHORT-RANGE ORDER IN AMORPHOUS SILICON [J].

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[9] STRUCTURAL INVESTIGATION OF HYDROGENATED AMORPHOUS-SILICON BY X-RAY-DIFFRACTION [J].

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