APPLICATION OF SCANNING TUNNELING MICROSCOPY TO DISORDERED-SYSTEMS

[1] BECK H, 1981, GLASSY METALS, V1, P2

[2] FIELD-ION MICROSCOPE ATOM PROBE STUDIES OF METALLIC GLASSES [J]. PHILOSOPHICAL MAGAZINE B-PHYSICS OF CONDENSED MATTER STATISTICAL MECHANICS ELECTRONIC OPTICAL AND MAGNETIC PROPERTIES, 1985, 52 (04): : L63 - L69

[3] SCANNING TUNNELING MICROSCOPY [J]. SURFACE SCIENCE, 1983, 126 (1-3) : 236 - 244

[4] BRUNNER AJ, IN PRESS NUCL INST B

[5] IMAGING IN REAL-TIME WITH THE TUNNELING MICROSCOPE [J]. APPLIED PHYSICS LETTERS, 1986, 48 (13) : 832 - 834

[6] Carter G., 1983, SPUTTERING PARTICLE, P231

[7] SURFACE-MORPHOLOGY OF OXIDIZED AND ION-ETCHED SILICON BY SCANNING TUNNELING MICROSCOPY [J]. APPLIED PHYSICS LETTERS, 1985, 47 (02) : 97 - 99

[8] GUNTHERODT HJ, 1981, I PHYS C SER, V55, P619

[9] MICROCRYSTALLINE DOMAINS IN AMORPHOUS PD77.5CU6SI16.5 ALLOYS STUDIED BY HIGH-RESOLUTION ELECTRON-MICROSCOPY [J]. JOURNAL OF APPLIED PHYSICS, 1986, 59 (09) : 3081 - 3086

[10] ON THE FIELD-ION MICROSCOPY OF METALLIC-GLASS [J]. PHILOSOPHICAL MAGAZINE B-PHYSICS OF CONDENSED MATTER STATISTICAL MECHANICS ELECTRONIC OPTICAL AND MAGNETIC PROPERTIES, 1985, 52 (01): : L21 - L24

[1] BECK H, 1981, GLASSY METALS, V1, P2

[2] FIELD-ION MICROSCOPE ATOM PROBE STUDIES OF METALLIC GLASSES [J]. PHILOSOPHICAL MAGAZINE B-PHYSICS OF CONDENSED MATTER STATISTICAL MECHANICS ELECTRONIC OPTICAL AND MAGNETIC PROPERTIES, 1985, 52 (04): : L63 - L69

[3] SCANNING TUNNELING MICROSCOPY [J]. SURFACE SCIENCE, 1983, 126 (1-3) : 236 - 244

[4] BRUNNER AJ, IN PRESS NUCL INST B

[5] IMAGING IN REAL-TIME WITH THE TUNNELING MICROSCOPE [J]. APPLIED PHYSICS LETTERS, 1986, 48 (13) : 832 - 834

[6] Carter G., 1983, SPUTTERING PARTICLE, P231

[7] SURFACE-MORPHOLOGY OF OXIDIZED AND ION-ETCHED SILICON BY SCANNING TUNNELING MICROSCOPY [J]. APPLIED PHYSICS LETTERS, 1985, 47 (02) : 97 - 99

[8] GUNTHERODT HJ, 1981, I PHYS C SER, V55, P619

[9] MICROCRYSTALLINE DOMAINS IN AMORPHOUS PD77.5CU6SI16.5 ALLOYS STUDIED BY HIGH-RESOLUTION ELECTRON-MICROSCOPY [J]. JOURNAL OF APPLIED PHYSICS, 1986, 59 (09) : 3081 - 3086

[10] ON THE FIELD-ION MICROSCOPY OF METALLIC-GLASS [J]. PHILOSOPHICAL MAGAZINE B-PHYSICS OF CONDENSED MATTER STATISTICAL MECHANICS ELECTRONIC OPTICAL AND MAGNETIC PROPERTIES, 1985, 52 (01): : L21 - L24