OPTIMAL SIGNAL-PROCESSING IN ELECTRONIC SPECKLE PATTERN INTERFEROMETRY

被引：9

作者：

SLETTEMOEN, GA ^{[1
]}

机构：

[1] UNIV TRONDHEIM,NORWEGIAN INST TECHNOL,DEPT PHYS,N-7034 TRONDHEIM,NORWAY

来源：

关键词：

D O I：

10.1016/0030-4018(77)90309-1

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

引用

页码：213 / 216

页数：4

共 17 条

[1] BIBERMANN LM, 1971, PHOTOELECTRONIC IMAG, V1
[2] BIBERMANN LM, 1971, PHOTOELECTRONIC IMAG, V2
[3] Butters J. N., 1971, Optics and Laser Technology, V3, P26, DOI 10.1016/S0030-3992(71)80007-5
[4] HOLOGRAPHIC AND VIDEO TECHNIQUES APPLIED TO ENGINEERING MEASUREMENT
BUTTERS, JN
LEENDERTZ, JA
[J]. MEASUREMENT AND CONTROL, 1971, 4 (12): : 349 - +
[5] Dainty J., 1975, TOP APPL PHYS, P9, DOI [DOI 10.1007/BFB0111436, 10.1007/BFb0111436]
[6] Ek L., 1971, Optics Communications, V2, P419, DOI 10.1016/0030-4018(71)90057-5
[7] FRINGE CONTRAST IN A SYSTEM FOR HOLOGRAM INTERFEROMETRY WITH LOW RESOLUTION IMAGING DEVICES
EK, L
BIEDERMANN, K
[J]. JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1975, 8 (08): : 691 - 696
[8] DETECTION AND MEASUREMENT OF SMALL VIBRATIONS USING ELECTRONIC SPECKLE PATTERN INTERFEROMETRY
HOGMOEN, K
LOKBERG, OJ
[J]. APPLIED OPTICS, 1977, 16 (07): : 1869 - 1875
[9] HOMEDICKSON J, 1970, OPTICAL INSTRUMENTS, P265
[10] USE OF MODULATED REFERENCE WAVE IN ELECTRONIC SPECKLE PATTERN INTERFEROMETRY
LOKBERG, OJ
HOGMOEN, K
[J]. JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1976, 9 (10): : 847 - 851