HIGH-STABILITY BIMORPH SCANNING TUNNELING MICROSCOPE

被引:28
作者
BLACKFORD, BL
DAHN, DC
JERICHO, MH
机构
关键词
D O I
10.1063/1.1139658
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
引用
收藏
页码:1343 / 1348
页数:6
相关论文
共 16 条
[1]  
BINNIG G, 1986, IBM J RES DEV, V30, P355
[2]   ATOMIC FORCE MICROSCOPE [J].
BINNIG, G ;
QUATE, CF ;
GERBER, C .
PHYSICAL REVIEW LETTERS, 1986, 56 (09) :930-933
[3]   SCANNING TUNNELING MICROSCOPY [J].
BINNIG, G ;
ROHRER, H .
SURFACE SCIENCE, 1983, 126 (1-3) :236-244
[4]   IMAGING IN REAL-TIME WITH THE TUNNELING MICROSCOPE [J].
BRYANT, A ;
SMITH, DPE ;
QUATE, CF .
APPLIED PHYSICS LETTERS, 1986, 48 (13) :832-834
[5]   A SIMPLIFIED SCANNING TUNNELING MICROSCOPE FOR SURFACE SCIENCE STUDIES [J].
DEMUTH, JE ;
HAMERS, RJ ;
TROMP, RM ;
WELLAND, ME .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1986, 4 (03) :1320-1323
[6]   TUNNELING MICROSCOPE FOR OPERATION IN AIR OR FLUIDS [J].
DRAKE, B ;
SONNENFELD, R ;
SCHNEIR, J ;
HANSMA, PK ;
SLOUGH, G ;
COLEMAN, RV .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1986, 57 (03) :441-445
[7]   NEAR-FIELD OPTICAL-SCANNING MICROSCOPY WITH TUNNEL-DISTANCE REGULATION [J].
DURIG, U ;
POHL, D ;
ROHNER, F .
IBM JOURNAL OF RESEARCH AND DEVELOPMENT, 1986, 30 (05) :478-483
[8]   SCANNING TUNNELING MICROSCOPE COMBINED WITH A SCANNING ELECTRON-MICROSCOPE [J].
GERBER, C ;
BINNIG, G ;
FUCHS, H ;
MARTI, O ;
ROHRER, H .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1986, 57 (02) :221-224
[9]   SILVER FILMS CONDENSED AT 300-K AND 90-K - SCANNING TUNNELING MICROSCOPY OF THEIR SURFACE-TOPOGRAPHY [J].
GIMZEWSKI, JK ;
HUMBERT, A ;
BEDNORZ, JG ;
REIHL, B .
PHYSICAL REVIEW LETTERS, 1985, 55 (09) :951-954
[10]   SCANNING TUNNELING MICROSCOPE WITH MICROMETER APPROACH AND THERMAL COMPENSATION [J].
JERICHO, MH ;
DAHN, DC ;
BLACKFORD, BL .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1987, 58 (08) :1349-1352