SCANNING TUNNELING MICROSCOPE WITH MICROMETER APPROACH AND THERMAL COMPENSATION

被引：19

作者：

JERICHO, MH

DAHN, DC

BLACKFORD, BL

机构：

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 1987年 / 58卷 / 08期

关键词：

D O I：

10.1063/1.1139414

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：1349 / 1352

页数：4

共 13 条

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