VISUALIZATION OF DYNAMIC NEAR-SURFACE PROCESSES

被引：11

作者：

TWESTEN, RD

GIBSON, JM

ROSS, FM

机构：

[1] UNIV ILLINOIS,DEPT MAT SCI,URBANA,IL 61801

[2] WAYNE STATE UNIV,DETROIT,MI 48202

[3] LAWRENCE BERKELEY LAB,NATL CTR ELECTRON MICROSCOPY,BERKELEY,CA 94720

来源：

MRS BULLETIN | 1994年 / 19卷 / 06期

关键词：

D O I：

10.1557/S0883769400036745

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

[No abstract available]

引用

页码：38 / 43

页数：6

共 22 条

[1] DIRECT RESOLUTION OF SURFACE ATOMIC STEPS BY TRANSMISSION ELECTRON-MICROSCOPY [J].

CHERNS, D .

PHILOSOPHICAL MAGAZINE, 1974, 30 (03) :549-556

[2]

Cowley J.M., 1975, DIFFRACTION PHYS, V1

[3] EVIDENCE FOR A STABLE SI(111)7X7-O RECONSTRUCTION FROM QUANTITATIVE TRANSMISSION ELECTRON-DIFFRACTION [J].

GIBSON, JM .

SURFACE SCIENCE, 1990, 239 (1-2) :L531-L536

[4] INSITU STUDY OF THE MOLECULAR-BEAM EPITAXY OF COSI2 ON (111) SI BY TRANSMISSION ELECTRON-MICROSCOPY AND DIFFRACTION [J].

GIBSON, JM ;

BATSTONE, JL ;

TUNG, RT .

APPLIED PHYSICS LETTERS, 1987, 51 (01) :45-47

[5] INSITU TRANSMISSION ELECTRON-MICROSCOPY OF NISI2 FORMATION BY MOLECULAR-BEAM EPITAXY [J].

GIBSON, JM ;

BATSTONE, JL .

SURFACE SCIENCE, 1989, 208 (03) :317-350

[6] PLAN-VIEW TRANSMISSION ELECTRON-DIFFRACTION MEASUREMENT OF ROUGHNESS AT BURIED SI/SIO2 INTERFACES [J].

GIBSON, JM ;

LANZEROTTI, MY ;

ELSER, V .

APPLIED PHYSICS LETTERS, 1989, 55 (14) :1394-1396

[7]

HIRSCH PB, 1967, ELECTRON MICROSCOPY

[8] STRUCTURE OF SI(100)-(2X1) SURFACE USING UHV TRANSMISSION ELECTRON-DIFFRACTION [J].

JAYARAM, G ;

XU, P ;

MARKS, LD .

PHYSICAL REVIEW LETTERS, 1993, 71 (21) :3489-3492

[9]

MARSHALL MT, 1993, 51ST P ANN M MICR SO, P641

[10] DIRECT MEASUREMENT OF CRYSTAL-SURFACE STRESS [J].

MARTINEZ, RE ;

AUGUSTYNIAK, WM ;

GOLOVCHENKO, JA .

PHYSICAL REVIEW LETTERS, 1990, 64 (09) :1035-1038

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