OXIDATION OF POLYCRYSTALLINE AND (111) LEAD SURFACES STUDIED BY ELECTRON-SPECTROSCOPY

[1] LCAO BAND-STRUCTURE AND DENSITY OF STATES OF LEAD [J]. SOLID STATE COMMUNICATIONS, 1974, 14 (05) : 395 - 397

[2] APPLICATION OF ELECTRON-SPECTROSCOPY TO SURFACE STUDIES [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1974, 11 (01): : 212 - 224

[3] OXIDATION OF LEAD OVERLAYERS ON COPPER [J]. SURFACE SCIENCE, 1979, 82 (01) : L293 - L297

[4] CHADWICK DE, UNPUBLISHED

[5] Chou N. J., 1973, Journal of Electronic Materials, V2, P115, DOI 10.1007/BF02658106

[6] GROWTH OF THIN PBO LAYERS ON LEAD FILMS .1. EXPERIMENT [J]. SURFACE SCIENCE, 1973, 40 (03) : 512 - 530

[7] ELECTRON MEAN ESCAPE DEPTHS FROM X-RAY PHOTOELECTRON-SPECTRA OF THERMALLY OXIDIZED SILICON DIOXIDE FILMS ON SILICON [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1975, 12 (01): : 305 - 308

[8] SURFACE SENSITIVITY AND ANGULAR DEPENDENCE OF X-RAY PHOTOELECTRON SPECTRA [J]. SURFACE SCIENCE, 1973, 36 (02) : 661 - 674

[9] INVESTIGATION OF OXIDATION OF POLYCRYSTALLINE LEAD BY XPS AND SIMS [J]. SURFACE SCIENCE, 1978, 78 (01) : 1 - 14

[10] LOW-ENERGY ELECTRON-DIFFRACTION AND ELECTRON SPECTROSCOPIC STUDIES OF OXIDATION AND SULFIDATION OF PB(100) AND PB(110) SURFACES [J]. PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL AND PHYSICAL SCIENCES, 1978, 358 (1693) : 223 - +

[1] LCAO BAND-STRUCTURE AND DENSITY OF STATES OF LEAD [J]. SOLID STATE COMMUNICATIONS, 1974, 14 (05) : 395 - 397

[2] APPLICATION OF ELECTRON-SPECTROSCOPY TO SURFACE STUDIES [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1974, 11 (01): : 212 - 224

[3] OXIDATION OF LEAD OVERLAYERS ON COPPER [J]. SURFACE SCIENCE, 1979, 82 (01) : L293 - L297

[4] CHADWICK DE, UNPUBLISHED

[5] Chou N. J., 1973, Journal of Electronic Materials, V2, P115, DOI 10.1007/BF02658106

[6] GROWTH OF THIN PBO LAYERS ON LEAD FILMS .1. EXPERIMENT [J]. SURFACE SCIENCE, 1973, 40 (03) : 512 - 530

[7] ELECTRON MEAN ESCAPE DEPTHS FROM X-RAY PHOTOELECTRON-SPECTRA OF THERMALLY OXIDIZED SILICON DIOXIDE FILMS ON SILICON [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1975, 12 (01): : 305 - 308

[8] SURFACE SENSITIVITY AND ANGULAR DEPENDENCE OF X-RAY PHOTOELECTRON SPECTRA [J]. SURFACE SCIENCE, 1973, 36 (02) : 661 - 674

[9] INVESTIGATION OF OXIDATION OF POLYCRYSTALLINE LEAD BY XPS AND SIMS [J]. SURFACE SCIENCE, 1978, 78 (01) : 1 - 14

[10] LOW-ENERGY ELECTRON-DIFFRACTION AND ELECTRON SPECTROSCOPIC STUDIES OF OXIDATION AND SULFIDATION OF PB(100) AND PB(110) SURFACES [J]. PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL AND PHYSICAL SCIENCES, 1978, 358 (1693) : 223 - +