共 25 条
- [1] AITCHISON RE, 1954, AUSTRALIAN J APPL SC, V5, P10
- [2] [Anonymous], 1953, VACUUM, DOI DOI 10.1016/0042-207X(53)90411-4
- [3] TIN OXIDE THIN FILM TRANSISTORS [J]. JAPANESE JOURNAL OF APPLIED PHYSICS, 1970, 9 (05) : 582 - &
- [4] PERTURBED ANGULAR-CORRELATION STUDIES OF THE OXIDATION OF IMPLANTED IN-111 IN FCC METALS [J]. MATERIALS SCIENCE AND ENGINEERING, 1985, 69 (02): : 375 - 379
- [5] PERTURBED ANGULAR-CORRELATION EXPERIMENTS ON IN-111 IN OXIDIZED FCC METALS AND THEIR OXIDES [J]. PHYSICAL REVIEW B, 1987, 36 (04): : 1818 - 1830
- [6] KINETICS STUDIES AND OXIDE CHARACTERIZATION IN THE INTERNAL OXIDATION OF AGIN ALLOYS [J]. PHYSICAL REVIEW B, 1983, 28 (10): : 5739 - 5745
- [7] TDPAC STUDIES IN THE SEMICONDUCTORS SNO2 AND CU2O [J]. HYPERFINE INTERACTIONS, 1987, 34 (1-4): : 271 - 275
- [9] FRAUENFELDER H, 1966, ALPHA BETA GAMMA RAY, P997
- [10] JARZEBSKI ZM, 1976, J ELECTROCHEM SOC, V123, pC199, DOI [10.1149/1.2133010, 10.1149/1.2132647, 10.1149/1.2133090]