EBIC ANALYSIS OF CUINSE2 DEVICES

被引：10

作者：

CHESAREK, W

MITCHELL, K

MASON, A

FABICK, L

机构：

[1] ARCO Solar Inc, United States

来源：

SOLAR CELLS | 1988年 / 24卷 / 3-4期

关键词：

Copper Compounds - Electron Beams - Semiconductor Devices - Junctions - Semiconductor Materials;

D O I：

10.1016/0379-6787(88)90077-4

中图分类号：

TE [石油、天然气工业]; TK [能源与动力工程];

学科分类号：

0807 ; 0820 ;

摘要：

This paper describes the electron-beam-induced-current (EBIC) technique and its application to the characterization of CuInSe2 thin film solar cells. The collected current generated by a scanning electron microscope electron beam can be used to determine spatial nonuniformities, localized defects, p-n junctions, minority carrier lifetimes and diffusion lengths in solar cells. Spatial EBIC images permit examination to 5000× magnification compared with 50× for optical-beam-induced current (OBIC) images.

引用

页码：263 / 270

页数：8

共 15 条

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