ELECTROCHEMICAL ASPECTS OF STM AND RELATED TECHNIQUES

被引:36
作者
CHRISTENSEN, PA
机构
关键词
D O I
10.1039/cs9922100197
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
The application of Scanning Tunelling Microscopy, Scanning Tunelling Spectroscopy, and Atomic Force Microscopy to electrochemistry is reviewed, with particular reference to the practical aspects. A selection of recent work emphasizing the kind of information that can be obtained using these novel techniques is also discussed.
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页码:197 / 208
页数:12
相关论文
共 26 条
[1]   REAL-SPACE OBSERVATION OF SURFACE-STATES ON SI(111)7X7 WITH THE TUNNELING MICROSCOPE [J].
BECKER, RS ;
GOLOVCHENKO, JA ;
HAMANN, DR ;
SWARTZENTRUBER, BS .
PHYSICAL REVIEW LETTERS, 1985, 55 (19) :2032-2034
[2]  
Beden B., 1988, SPECTROELECTROCHEMIS, P189
[3]   ATOMIC FORCE MICROSCOPE [J].
BINNIG, G ;
QUATE, CF ;
GERBER, C .
PHYSICAL REVIEW LETTERS, 1986, 56 (09) :930-933
[4]   SURFACE STUDIES BY SCANNING TUNNELING MICROSCOPY [J].
BINNING, G ;
ROHRER, H ;
GERBER, C ;
WEIBEL, E .
PHYSICAL REVIEW LETTERS, 1982, 49 (01) :57-61
[5]   INSITU SCANNING TUNNELING MICROSCOPY - NEW INSIGHT FOR ELECTROCHEMICAL ELECTRODE SURFACE INVESTIGATIONS [J].
CATALDI, TRI ;
BLACKHAM, IG ;
BRIGGS, GAD ;
PETHICA, JB ;
HILL, HAO .
JOURNAL OF ELECTROANALYTICAL CHEMISTRY, 1990, 290 (1-2) :1-20
[6]  
CATALDI TRI, COMMUNICATION
[7]   INSITU SCANNING TUNNELING MICROSCOPY AT POTENTIAL CONTROLLED AG(100) SUBSTRATES [J].
CHRISTOPH, R ;
SIEGENTHALER, H ;
ROHRER, H ;
WIESE, H .
ELECTROCHIMICA ACTA, 1989, 34 (08) :1011-1022
[8]   PHOTOELECTRON-SPECTROSCOPY OF HYDRATED ELECTRON CLUSTER ANIONS, (H2O)N-=2-69 [J].
COE, JV ;
LEE, GH ;
EATON, JG ;
ARNOLD, ST ;
SARKAS, HW ;
BOWEN, KH ;
LUDEWIGT, C ;
HABERLAND, H ;
WORSNOP, DR .
JOURNAL OF CHEMICAL PHYSICS, 1990, 92 (06) :3980-3982
[9]  
COMPTON RG, 1989, COMPREHENSIVE CHEM K, V29