CONVERGENT-BEAM IMAGING - A TRANSMISSION ELECTRON-MICROSCOPY TECHNIQUE FOR INVESTIGATING SMALL LOCALIZED DISTORTIONS IN CRYSTALS

被引：39

作者：

HUMPHREYS, CJ

MAHER, DM

FRASER, HL

EAGLESHAM, DJ

机构：

[1] AT&T BELL LABS,MURRAY HILL,NJ 07974

[2] UNIV ILLINOIS,DEPT MAT SCI & ENGN,URBANA,IL 61801

来源：

PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES | 1988年 / 58卷 / 05期

关键词：

D O I：

10.1080/01418618808209953

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：787 / 798

页数：12

共 15 条

[1] GEXSI1-X/SI STRAINED-LAYER SUPERLATTICE GROWN BY MOLECULAR-BEAM EPITAXY
BEAN, JC
FELDMAN, LC
FIORY, AT
NAKAHARA, S
ROBINSON, IK
[J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1984, 2 (02): : 436 - 440
[2] STRAINED-LAYER EPITAXY OF GERMANIUM-SILICON ALLOYS
BEAN, JC
[J]. SCIENCE, 1985, 230 (4722) : 127 - 131
[3] APPLICATIONS OF MODERN MICRODIFFRACTION TO MATERIALS SCIENCE
CARPENTER, RW
SPENCE, JCH
[J]. JOURNAL OF MICROSCOPY-OXFORD, 1984, 136 (NOV): : 165 - 178
[4] ON PARALLEL ILLUMINATION IN THE TRANSMISSION ELECTRON-MICROSCOPE
CHRISTENSON, KK
EADES, JA
[J]. ULTRAMICROSCOPY, 1986, 19 (02) : 191 - 194
[5] FRASER HL, 1985, I PHYS C SER, V76, P307
[6] ELASTIC RELAXATION IN TRANSMISSION ELECTRON-MICROSCOPY OF STRAINED-LAYER SUPERLATTICES
GIBSON, JM
HULL, R
BEAN, JC
TREACY, MMJ
[J]. APPLIED PHYSICS LETTERS, 1985, 46 (07) : 649 - 651
[7] PRACTICAL METHOD OF 3-DIMENSIONAL SPACE-GROUP ANALYSIS USING CONVERGENT-BEAM ELECTRON-DIFFRACTION
GOODMAN, P
[J]. ACTA CRYSTALLOGRAPHICA SECTION A, 1975, 31 (NOV1): : 804 - &
[8] STUDY OF THIN CRYSTALLINE FILMS BY UNIVERSAL ELECTRON DIFFRACTION MICROSCOPE
HASHIMOTO, H
[J]. JOURNAL OF THE PHYSICAL SOCIETY OF JAPAN, 1954, 9 (02) : 150 - 161
[9] HIRSCH PB, 1965, ELECTRON MICROSCOPY
[10] JONES PB, 1977, P R SOC A, V354, P102