INITIAL GROWTH-MECHANISM OF BI-SR-CA-CU-O THIN-FILMS ON SRTIO3(110) SURFACES STUDIED BY INSITU REFLECTION HIGH-ENERGY ELECTRON-DIFFRACTION OBSERVATION

被引：4

作者：

MIURA, T

ISHIZUKA, Y

机构：

[1] Research and Development Center, Toshiba Corporation, Saiwai-ku, Kawasaki, 210

来源：

THIN SOLID FILMS | 1993年 / 228卷 / 1-2期

关键词：

D O I：

10.1016/0040-6090(93)90595-G

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

The initial growth mechanism of Bi2Sr2Can-1CunOx (BSCCO) films was investigated on SrTiO3 (110) surfaces by in-situ reflection high energy electron diffraction (RHEED) observation. The orientations in the BSCCO thin films were controlled by the flux of metal elements in the initial growth stage. A preceding deposition of Bi produced a RHEED pattern indicating the formation of a bismuth oxide layer which assisted the growth of a half-unit cell at the beginning of codeposition. A (Bi:Sr:Ca:Cu =) 2:2:1:2 phase (117) orientation mixed with a c axis orientation was obtained. A preceding deposition of Sr, Ca and Cu produced a pattern indicating the formation of (Sr1-xCax)2CuO3 and caused epitaxial growth just after the start of codeposition, based on the structural relationship between the substrate and the perovskite structure part of the films. A 2:2:1:2 phase (119) orientation was formed.

引用

页码：189 / 192

页数：4