DIGITAL CHARACTERISTICS OF CMOS DEVICES AT CRYOGENIC TEMPERATURES

被引：10

作者：

DEEN, MJ

机构：

来源：

IEEE JOURNAL OF SOLID-STATE CIRCUITS | 1989年 / 24卷 / 01期

关键词：

D O I：

10.1109/4.16315

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：158 / 164

页数：7

共 21 条

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