学术探索
学术期刊
新闻热点
数据分析
智能评审
立即登录
INFLUENCE OF SPUTTERING ON THE SURFACE-COMPOSITION OF FE-CR-MO ALLOYS
被引:37
作者
:
MATHIEU, HJ
论文数:
0
引用数:
0
h-index:
0
机构:
Materials Department, Swiss Federal Institute of Technology
MATHIEU, HJ
LANDOLT, D
论文数:
0
引用数:
0
h-index:
0
机构:
Materials Department, Swiss Federal Institute of Technology
LANDOLT, D
机构
:
[1]
Materials Department, Swiss Federal Institute of Technology
来源
:
APPLICATIONS OF SURFACE SCIENCE
|
1979年
/ 3卷
/ 03期
关键词
:
D O I
:
10.1016/0378-5963(79)90004-7
中图分类号
:
学科分类号
:
摘要
:
Auger electron spectroscopy (AES) combined with Kr+-sputtering was applied to investigate the influence of sputtering on surface composition of ternary Fe-Cr-Mo alloys. AES-amplitude ratios of fractured alloys were compared to those of alloys that were sputtered to steady state conditions. Preferential sputtering leads to the enrichment of Mo at the surface. A preferential sputter model originally developed for binary alloys shows reasonable agreement with obtained results. © 1979.
引用
收藏
页码:348 / 355
页数:8
相关论文
共 16 条
[1]
ANALYSIS PROFILES OF OXIDE-FILMS ON CHROME STEEL BY AUGER EMISSION AND X-RAY PHOTOELECTRON SPECTROSCOPIES
COAD, JP
论文数:
0
引用数:
0
h-index:
0
机构:
ATOM ENERGY RES ESTAB, MAT DEV DIV, HARWELL, BERKSHIRE, ENGLAND
COAD, JP
CUNNINGHAM, JG
论文数:
0
引用数:
0
h-index:
0
机构:
ATOM ENERGY RES ESTAB, MAT DEV DIV, HARWELL, BERKSHIRE, ENGLAND
CUNNINGHAM, JG
[J].
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA,
1974,
3
(06)
: 435
-
448
[2]
COAD JP, 1975, R7944 AERE REP
[3]
STUDY BY AUGER SPECTROMETRY AND CATHODIC REDUCTION OF PASSIVE FILMS FORMED ON FERRITIC STAINLESS-STEELS
CUNHABELO, MD
论文数:
0
引用数:
0
h-index:
0
机构:
NATL CTR SCI RES,F-94400 VITRY SUR SEINE,FRANCE
NATL CTR SCI RES,F-94400 VITRY SUR SEINE,FRANCE
CUNHABELO, MD
RONDOT, B
论文数:
0
引用数:
0
h-index:
0
机构:
NATL CTR SCI RES,F-94400 VITRY SUR SEINE,FRANCE
NATL CTR SCI RES,F-94400 VITRY SUR SEINE,FRANCE
RONDOT, B
PONS, F
论文数:
0
引用数:
0
h-index:
0
机构:
NATL CTR SCI RES,F-94400 VITRY SUR SEINE,FRANCE
NATL CTR SCI RES,F-94400 VITRY SUR SEINE,FRANCE
PONS, F
LEHERICY, J
论文数:
0
引用数:
0
h-index:
0
机构:
NATL CTR SCI RES,F-94400 VITRY SUR SEINE,FRANCE
NATL CTR SCI RES,F-94400 VITRY SUR SEINE,FRANCE
LEHERICY, J
LANGERON, JP
论文数:
0
引用数:
0
h-index:
0
机构:
NATL CTR SCI RES,F-94400 VITRY SUR SEINE,FRANCE
NATL CTR SCI RES,F-94400 VITRY SUR SEINE,FRANCE
LANGERON, JP
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1977,
124
(09)
: 1317
-
1324
[4]
ANALYSIS OF AIR-FORMED OXIDE FILM ON A SERIES OF IRON-CHROMIUM ALLOYS BY ION-SCATTERING SPECTROMETRY
FRANKENTHAL, RP
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS INC,MURRAY HILL,NJ 07974
BELL TEL LABS INC,MURRAY HILL,NJ 07974
FRANKENTHAL, RP
MALM, DL
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS INC,MURRAY HILL,NJ 07974
BELL TEL LABS INC,MURRAY HILL,NJ 07974
MALM, DL
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1976,
123
(02)
: 186
-
191
[5]
EFFECT OF MOLYBDENUM ON PITTING POTENTIAL OF HIGH-PURITY 18-PERCENT CR FERRITIC STAINLESS-STEELS
GALVELE, JR
论文数:
0
引用数:
0
h-index:
0
机构:
OHIO STATE UNIV,COLUMBUS,OH 43210
OHIO STATE UNIV,COLUMBUS,OH 43210
GALVELE, JR
LUMSDEN, JB
论文数:
0
引用数:
0
h-index:
0
机构:
OHIO STATE UNIV,COLUMBUS,OH 43210
OHIO STATE UNIV,COLUMBUS,OH 43210
LUMSDEN, JB
STAEHLE, RW
论文数:
0
引用数:
0
h-index:
0
机构:
OHIO STATE UNIV,COLUMBUS,OH 43210
OHIO STATE UNIV,COLUMBUS,OH 43210
STAEHLE, RW
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1978,
125
(08)
: 1204
-
1208
[6]
RELATIVE SENSITIVITY FACTORS FOR QUANTITATIVE AUGER ANALYSIS OF BINARY-ALLOYS
HALL, PM
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS INC,ALLENTOWN,PA 18103
HALL, PM
MORABITO, JM
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS INC,ALLENTOWN,PA 18103
MORABITO, JM
CONLEY, DK
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS INC,ALLENTOWN,PA 18103
CONLEY, DK
[J].
SURFACE SCIENCE,
1977,
62
(01)
: 1
-
20
[7]
AUGER STUDY OF PREFERRED SPUTTERING ON BINARY ALLOY SURFACES
HO, PS
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP THOMAS J WATSON RES CTR, YORKTOWN HTS, NY 10598 USA
HO, PS
LEWIS, JE
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP THOMAS J WATSON RES CTR, YORKTOWN HTS, NY 10598 USA
LEWIS, JE
WILDMAN, HS
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP THOMAS J WATSON RES CTR, YORKTOWN HTS, NY 10598 USA
WILDMAN, HS
HOWARD, JK
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP THOMAS J WATSON RES CTR, YORKTOWN HTS, NY 10598 USA
HOWARD, JK
[J].
SURFACE SCIENCE,
1976,
57
(01)
: 393
-
405
[8]
QUANTITATIVE AUGER-ELECTRON ANALYSIS OF HOMOGENEOUS BINARY-ALLOYS - CHROMIUM IN GOLD
HOLLOWAY, PH
论文数:
0
引用数:
0
h-index:
0
机构:
SANDIA LABS,ALBUQUERQUE,NM 87115
SANDIA LABS,ALBUQUERQUE,NM 87115
HOLLOWAY, PH
[J].
SURFACE SCIENCE,
1977,
66
(02)
: 479
-
494
[9]
LANDOLT D, 1978, 29TH M INT SOC EL BU
[10]
QUANTITATIVE AUGER-ELECTRON SPECTROSCOPY ANALYSIS OF AG-PD AND NI-PD ALLOYS
MATHIEU, HJ
论文数:
0
引用数:
0
h-index:
0
机构:
SWISS FED INST TECHNOL,MAT DEPT,LAUSANNE,SWITZERLAND
SWISS FED INST TECHNOL,MAT DEPT,LAUSANNE,SWITZERLAND
MATHIEU, HJ
LANDOLT, D
论文数:
0
引用数:
0
h-index:
0
机构:
SWISS FED INST TECHNOL,MAT DEPT,LAUSANNE,SWITZERLAND
SWISS FED INST TECHNOL,MAT DEPT,LAUSANNE,SWITZERLAND
LANDOLT, D
[J].
SURFACE SCIENCE,
1975,
53
(DEC)
: 228
-
240
←
1
2
→
共 16 条
[1]
ANALYSIS PROFILES OF OXIDE-FILMS ON CHROME STEEL BY AUGER EMISSION AND X-RAY PHOTOELECTRON SPECTROSCOPIES
COAD, JP
论文数:
0
引用数:
0
h-index:
0
机构:
ATOM ENERGY RES ESTAB, MAT DEV DIV, HARWELL, BERKSHIRE, ENGLAND
COAD, JP
CUNNINGHAM, JG
论文数:
0
引用数:
0
h-index:
0
机构:
ATOM ENERGY RES ESTAB, MAT DEV DIV, HARWELL, BERKSHIRE, ENGLAND
CUNNINGHAM, JG
[J].
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA,
1974,
3
(06)
: 435
-
448
[2]
COAD JP, 1975, R7944 AERE REP
[3]
STUDY BY AUGER SPECTROMETRY AND CATHODIC REDUCTION OF PASSIVE FILMS FORMED ON FERRITIC STAINLESS-STEELS
CUNHABELO, MD
论文数:
0
引用数:
0
h-index:
0
机构:
NATL CTR SCI RES,F-94400 VITRY SUR SEINE,FRANCE
NATL CTR SCI RES,F-94400 VITRY SUR SEINE,FRANCE
CUNHABELO, MD
RONDOT, B
论文数:
0
引用数:
0
h-index:
0
机构:
NATL CTR SCI RES,F-94400 VITRY SUR SEINE,FRANCE
NATL CTR SCI RES,F-94400 VITRY SUR SEINE,FRANCE
RONDOT, B
PONS, F
论文数:
0
引用数:
0
h-index:
0
机构:
NATL CTR SCI RES,F-94400 VITRY SUR SEINE,FRANCE
NATL CTR SCI RES,F-94400 VITRY SUR SEINE,FRANCE
PONS, F
LEHERICY, J
论文数:
0
引用数:
0
h-index:
0
机构:
NATL CTR SCI RES,F-94400 VITRY SUR SEINE,FRANCE
NATL CTR SCI RES,F-94400 VITRY SUR SEINE,FRANCE
LEHERICY, J
LANGERON, JP
论文数:
0
引用数:
0
h-index:
0
机构:
NATL CTR SCI RES,F-94400 VITRY SUR SEINE,FRANCE
NATL CTR SCI RES,F-94400 VITRY SUR SEINE,FRANCE
LANGERON, JP
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1977,
124
(09)
: 1317
-
1324
[4]
ANALYSIS OF AIR-FORMED OXIDE FILM ON A SERIES OF IRON-CHROMIUM ALLOYS BY ION-SCATTERING SPECTROMETRY
FRANKENTHAL, RP
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS INC,MURRAY HILL,NJ 07974
BELL TEL LABS INC,MURRAY HILL,NJ 07974
FRANKENTHAL, RP
MALM, DL
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS INC,MURRAY HILL,NJ 07974
BELL TEL LABS INC,MURRAY HILL,NJ 07974
MALM, DL
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1976,
123
(02)
: 186
-
191
[5]
EFFECT OF MOLYBDENUM ON PITTING POTENTIAL OF HIGH-PURITY 18-PERCENT CR FERRITIC STAINLESS-STEELS
GALVELE, JR
论文数:
0
引用数:
0
h-index:
0
机构:
OHIO STATE UNIV,COLUMBUS,OH 43210
OHIO STATE UNIV,COLUMBUS,OH 43210
GALVELE, JR
LUMSDEN, JB
论文数:
0
引用数:
0
h-index:
0
机构:
OHIO STATE UNIV,COLUMBUS,OH 43210
OHIO STATE UNIV,COLUMBUS,OH 43210
LUMSDEN, JB
STAEHLE, RW
论文数:
0
引用数:
0
h-index:
0
机构:
OHIO STATE UNIV,COLUMBUS,OH 43210
OHIO STATE UNIV,COLUMBUS,OH 43210
STAEHLE, RW
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1978,
125
(08)
: 1204
-
1208
[6]
RELATIVE SENSITIVITY FACTORS FOR QUANTITATIVE AUGER ANALYSIS OF BINARY-ALLOYS
HALL, PM
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS INC,ALLENTOWN,PA 18103
HALL, PM
MORABITO, JM
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS INC,ALLENTOWN,PA 18103
MORABITO, JM
CONLEY, DK
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS INC,ALLENTOWN,PA 18103
CONLEY, DK
[J].
SURFACE SCIENCE,
1977,
62
(01)
: 1
-
20
[7]
AUGER STUDY OF PREFERRED SPUTTERING ON BINARY ALLOY SURFACES
HO, PS
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP THOMAS J WATSON RES CTR, YORKTOWN HTS, NY 10598 USA
HO, PS
LEWIS, JE
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP THOMAS J WATSON RES CTR, YORKTOWN HTS, NY 10598 USA
LEWIS, JE
WILDMAN, HS
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP THOMAS J WATSON RES CTR, YORKTOWN HTS, NY 10598 USA
WILDMAN, HS
HOWARD, JK
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP THOMAS J WATSON RES CTR, YORKTOWN HTS, NY 10598 USA
HOWARD, JK
[J].
SURFACE SCIENCE,
1976,
57
(01)
: 393
-
405
[8]
QUANTITATIVE AUGER-ELECTRON ANALYSIS OF HOMOGENEOUS BINARY-ALLOYS - CHROMIUM IN GOLD
HOLLOWAY, PH
论文数:
0
引用数:
0
h-index:
0
机构:
SANDIA LABS,ALBUQUERQUE,NM 87115
SANDIA LABS,ALBUQUERQUE,NM 87115
HOLLOWAY, PH
[J].
SURFACE SCIENCE,
1977,
66
(02)
: 479
-
494
[9]
LANDOLT D, 1978, 29TH M INT SOC EL BU
[10]
QUANTITATIVE AUGER-ELECTRON SPECTROSCOPY ANALYSIS OF AG-PD AND NI-PD ALLOYS
MATHIEU, HJ
论文数:
0
引用数:
0
h-index:
0
机构:
SWISS FED INST TECHNOL,MAT DEPT,LAUSANNE,SWITZERLAND
SWISS FED INST TECHNOL,MAT DEPT,LAUSANNE,SWITZERLAND
MATHIEU, HJ
LANDOLT, D
论文数:
0
引用数:
0
h-index:
0
机构:
SWISS FED INST TECHNOL,MAT DEPT,LAUSANNE,SWITZERLAND
SWISS FED INST TECHNOL,MAT DEPT,LAUSANNE,SWITZERLAND
LANDOLT, D
[J].
SURFACE SCIENCE,
1975,
53
(DEC)
: 228
-
240
←
1
2
→