MOLECULAR-RESOLUTION IMAGES OF LANGMUIR-BLODGETT-FILMS USING ATOMIC FORCE MICROSCOPY

被引:215
作者
MEYER, E
HOWALD, L
OVERNEY, RM
HEINZELMANN, H
FROMMER, J
GUNTHERODT, HJ
WAGNER, T
SCHIER, H
ROTH, S
机构
[1] IBM CORP,ALMADEN RES LAB,SAN JOSE,CA 95120
[2] MAX PLANCK INST FESTKORPERFORSCH,W-7000 STUTTGART 80,GERMANY
关键词
D O I
10.1038/349398a0
中图分类号
O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];
学科分类号
07 ; 0710 ; 09 ;
摘要
THE ability to prepare thin films of amphiphilic molecules (Langmuir-Blodgett (LB) films) is valuable to many areas of research. In biology they provide models for ideal membranes; the two-dimensional behaviour and structural phase transitions are of fundamental interest in surface physics; and their tribological characteristics suggest potential engineering applications. For determining the structure of these films, the common techniques such as X-ray and neutron scattering are limited to thick (greater-than-or-similar-to 200 angstrom) multilayers. Thinner films can be studied by transmission electron microscopy and low-energy electron diffraction 1,2, but these electron-beam techniques tend to damage thin films. More recently, the scanning tunnelling microscope 3 has provided a non-destructive means of investigating the structures of LB films 4-6, but as the films are insulating, the interpretation of such images has been controversial. The atomic force microscope 7 is not plagued with these ambiguities, as it does not require a conductive sample. Here we present images, with molecular resolution, of LB films of cadmium arachidate deposited on an amorphous silicate substrate. Despite the disorder in the substrate, the films display a periodic structure over large distances (several hundreds of angstroms). This suggests that the adsorbed molecules near the interface are driven to self-assemble primarily, if not solely, by intermolecular forces rather than by dependence on substrate periodicity.
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页码:398 / 400
页数:3
相关论文
共 25 条
[1]   AN ATOMIC-RESOLUTION ATOMIC-FORCE MICROSCOPE IMPLEMENTED USING AN OPTICAL-LEVER [J].
ALEXANDER, S ;
HELLEMANS, L ;
MARTI, O ;
SCHNEIR, J ;
ELINGS, V ;
HANSMA, PK ;
LONGMIRE, M ;
GURLEY, J .
JOURNAL OF APPLIED PHYSICS, 1989, 65 (01) :164-167
[2]   ATOMIC FORCE MICROSCOPE [J].
BINNIG, G ;
QUATE, CF ;
GERBER, C .
PHYSICAL REVIEW LETTERS, 1986, 56 (09) :930-933
[3]   SURFACE STUDIES BY SCANNING TUNNELING MICROSCOPY [J].
BINNING, G ;
ROHRER, H ;
GERBER, C ;
WEIBEL, E .
PHYSICAL REVIEW LETTERS, 1982, 49 (01) :57-61
[4]   INTERACTION FORCES OF A SHARP TUNGSTEN TIP WITH MOLECULAR FILMS ON SILICON SURFACES [J].
BLACKMAN, GS ;
MATE, CM ;
PHILPOTT, MR .
PHYSICAL REVIEW LETTERS, 1990, 65 (18) :2270-2273
[5]   PROBING THE SURFACE FORCES OF MONOLAYER FILMS WITH AN ATOMIC-FORCE MICROSCOPE [J].
BURNHAM, NA ;
DOMINGUEZ, DD ;
MOWERY, RL ;
COLTON, RJ .
PHYSICAL REVIEW LETTERS, 1990, 64 (16) :1931-1934
[6]   ATOMIC FORCE MICROSCOPY USING OPTICAL INTERFEROMETRY [J].
ERLANDSSON, R ;
MCCLELLAND, GM ;
MATE, CM ;
CHIANG, S .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1988, 6 (02) :266-270
[7]   STM INVESTIGATION OF LANGMUIR-BLODGETT-FILMS [J].
FUCHS, H ;
SCHREPP, W ;
ROHRER, H .
SURFACE SCIENCE, 1987, 181 (1-2) :391-393
[8]   BOND-ORIENTATIONAL ORDER IN LANGMUIR-BLODGETT SURFACTANT MONOLAYERS [J].
GAROFF, S ;
DECKMAN, HW ;
DUNSMUIR, JH ;
ALVAREZ, MS ;
BLOCH, JM .
JOURNAL DE PHYSIQUE, 1986, 47 (04) :701-709
[9]  
GODDENHENRICH T, 1990, J VAC SCI TECHNOL A, V8, P383, DOI 10.1116/1.576401
[10]  
HEINZELMANN H, 1990, SCANNING TUNNELING M, P443