AN ATOMIC-RESOLUTION ATOMIC-FORCE MICROSCOPE IMPLEMENTED USING AN OPTICAL-LEVER

被引：511

作者：

ALEXANDER, S ^{[1
]}

HELLEMANS, L ^{[1
]}

MARTI, O ^{[1
]}

SCHNEIR, J ^{[1
]}

ELINGS, V ^{[1
]}

HANSMA, PK ^{[1
]}

LONGMIRE, M ^{[1
]}

GURLEY, J ^{[1
]}

机构：

[1] DIGITIAL INSTRUMENTS INC,SANTA BARBARA,CA 93110

来源：

JOURNAL OF APPLIED PHYSICS | 1989年 / 65卷 / 01期

关键词：

D O I：

10.1063/1.342563

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：164 / 167

页数：4

共 34 条

[1] ATOMIC RESOLUTION IMAGING OF A NONCONDUCTOR BY ATOMIC FORCE MICROSCOPY
ALBRECHT, TR
QUATE, CF
[J]. JOURNAL OF APPLIED PHYSICS, 1987, 62 (07) : 2599 - 2602
[2] ATOMIC RESOLUTION WITH THE ATOMIC FORCE MICROSCOPE ON CONDUCTORS AND NONCONDUCTORS
ALBRECHT, TR
QUATE, CF
[J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1988, 6 (02): : 271 - 274
[3] AMER NM, 1988, B AM PHYS SOC, V33, P319
[4] ATOMIC FORCE MICROSCOPE
BINNIG, G
QUATE, CF
GERBER, C
[J]. PHYSICAL REVIEW LETTERS, 1986, 56 (09) : 930 - 933
[5] ATOMIC RESOLUTION WITH ATOMIC FORCE MICROSCOPE
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GERBER, C
STOLL, E
ALBRECHT, TR
QUATE, CF
[J]. EUROPHYSICS LETTERS, 1987, 3 (12): : 1281 - 1286
[6] SINGLE-TUBE 3-DIMENSIONAL SCANNER FOR SCANNING TUNNELING MICROSCOPY
BINNIG, G
SMITH, DPE
[J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1986, 57 (08) : 1688 - 1689
[7] SURFACE STUDIES BY SCANNING TUNNELING MICROSCOPY
BINNING, G
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GERBER, C
WEIBEL, E
[J]. PHYSICAL REVIEW LETTERS, 1982, 49 (01) : 57 - 61
[8] SCANNING TUNNELING MICROSCOPY APPLIED TO OPTICAL-SURFACES
DRAGOSET, RA
YOUNG, RD
LAYER, HP
MIELCZAREK, SR
TEAGUE, EC
CELOTTA, RJ
[J]. OPTICS LETTERS, 1986, 11 (09) : 560 - 562
[9] SCANNING TUNNELING MICROSCOPY OF PROCESSES AT LIQUID SOLID INTERFACES
DRAKE, B
SONNENFELD, R
SCHNEIR, J
HANSMA, PK
[J]. SURFACE SCIENCE, 1987, 181 (1-2) : 92 - 97
[10] ATOMIC FORCE MICROSCOPY USING OPTICAL INTERFEROMETRY
ERLANDSSON, R
MCCLELLAND, GM
MATE, CM
CHIANG, S
[J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1988, 6 (02): : 266 - 270

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