ATOMIC RESOLUTION WITH THE ATOMIC FORCE MICROSCOPE ON CONDUCTORS AND NONCONDUCTORS

被引：192

作者：

ALBRECHT, TR

QUATE, CF

机构：

来源：

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS | 1988年 / 6卷 / 02期

关键词：

D O I：

10.1116/1.575441

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

引用

页码：271 / 274

页数：4

共 21 条

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[7] ATOMIC FORCE MICROSCOPY USING OPTICAL INTERFEROMETRY [J].

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JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1988, 6 (02) :266-270

[8] SCANNING TUNNELING MICROSCOPY [J].

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[10] ATOMIC FORCE MICROSCOPY OF LIQUID-COVERED SURFACES - ATOMIC RESOLUTION IMAGES [J].

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APPLIED PHYSICS LETTERS, 1987, 51 (07) :484-486

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