SCANNING TUNNELING MICROSCOPY APPLIED TO OPTICAL-SURFACES

[1] STYLUS PROFILING INSTRUMENT FOR MEASURING STATISTICAL PROPERTIES OF SMOOTH OPTICAL-SURFACES [J]. APPLIED OPTICS, 1981, 20 (10): : 1785 - 1802

[2] BINNIG G, 1983, SURF SCI, V131, pL379, DOI 10.1016/0039-6028(83)90112-7

[3] 7X7 RECONSTRUCTION ON SI(111) RESOLVED IN REAL SPACE [J]. PHYSICAL REVIEW LETTERS, 1983, 50 (02) : 120 - 123

[4] SCANNING TUNNELING MICROSCOPY [J]. SURFACE SCIENCE, 1983, 126 (1-3) : 236 - 244

[5] BROWN NJ, 1983, P SOC PHOTO-OPT INST, V381, P48

[6] DIRECT COMPARISON OF MECHANICAL AND OPTICAL MEASUREMENTS OF THE FINISH OF PRECISION MACHINED OPTICAL-SURFACES [J]. OPTICAL ENGINEERING, 1985, 24 (03) : 388 - 395

[7] DECKER DL, 1978, NBS SPEC PUBL, V541, P122

[8] SURFACE-ROUGHNESS STANDARDS, OBTAINED WITH THE SCANNING TUNNELING MICROSCOPE OPERATED AT ATMOSPHERIC AIR-PRESSURE [J]. METROLOGIA, 1985, 21 (03) : 135 - 138

[9] SANGER GM, 1983, P SOC PHOTO-OPT INST, V433, P2, DOI 10.1117/12.936782

[10] TOPOGRAFINER - INSTRUMENT FOR MEASURING SURFACE MICROTOPOGRAPHY [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1972, 43 (07) : 999 - &

[1] STYLUS PROFILING INSTRUMENT FOR MEASURING STATISTICAL PROPERTIES OF SMOOTH OPTICAL-SURFACES [J]. APPLIED OPTICS, 1981, 20 (10): : 1785 - 1802

[2] BINNIG G, 1983, SURF SCI, V131, pL379, DOI 10.1016/0039-6028(83)90112-7

[3] 7X7 RECONSTRUCTION ON SI(111) RESOLVED IN REAL SPACE [J]. PHYSICAL REVIEW LETTERS, 1983, 50 (02) : 120 - 123

[4] SCANNING TUNNELING MICROSCOPY [J]. SURFACE SCIENCE, 1983, 126 (1-3) : 236 - 244

[5] BROWN NJ, 1983, P SOC PHOTO-OPT INST, V381, P48

[6] DIRECT COMPARISON OF MECHANICAL AND OPTICAL MEASUREMENTS OF THE FINISH OF PRECISION MACHINED OPTICAL-SURFACES [J]. OPTICAL ENGINEERING, 1985, 24 (03) : 388 - 395

[7] DECKER DL, 1978, NBS SPEC PUBL, V541, P122

[8] SURFACE-ROUGHNESS STANDARDS, OBTAINED WITH THE SCANNING TUNNELING MICROSCOPE OPERATED AT ATMOSPHERIC AIR-PRESSURE [J]. METROLOGIA, 1985, 21 (03) : 135 - 138

[9] SANGER GM, 1983, P SOC PHOTO-OPT INST, V433, P2, DOI 10.1117/12.936782

[10] TOPOGRAFINER - INSTRUMENT FOR MEASURING SURFACE MICROTOPOGRAPHY [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1972, 43 (07) : 999 - &