ELEMENTAL MASS-SPECTROMETRY USING A MODERATE POWER MICROWAVE-INDUCED PLASMA AS AN ION-SOURCE

被引：30

作者：

SATZGER, RD ^{[1
]}

FRICKE, FL ^{[1
]}

CARUSO, JA ^{[1
]}

机构：

[1] UNIV CINCINNATI,DEPT CHEM,CINCINNATI,OH 45221

来源：

JOURNAL OF ANALYTICAL ATOMIC SPECTROMETRY | 1988年 / 3卷 / 02期

关键词：

D O I：

10.1039/ja9880300319

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

引用

页码：319 / 323

页数：5

共 14 条

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[2] PLASMA SOURCE-MASS SPECTROMETRY USING AN INDUCTIVELY COUPLED PLASMA AND A HIGH-RESOLUTION QUADRUPOLE MASS FILTER [J].

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[3] ELEMENTAL ANALYSIS WITH A MICROWAVE-INDUCED PLASMA-QUADRUPOLE MASS-SPECTROMETER SYSTEM [J].

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[4] ELEMENTAL ANALYSIS WITH AN ATMOSPHERIC-PRESSURE PLASMA (MIP, ICP) QUADRUPOLE MASS-SPECTROMETER SYSTEM [J].

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[5]

GRAY AL, 1975, ANAL CHEM, V47, P600, DOI 10.1021/ac60353a049

[6]

GRAY AL, 1979, DYN MASS SPECTROM, V5, P106

[7]

GRAY AL, 1976, DYNAMIC MASS SPECTRO, V4, P153

[8] CHARACTERIZATION OF A MODERATE-POWER MICROWAVE-INDUCED PLASMA FOR DIRECT SOLUTION NEBULIZATION OF METAL-IONS [J].

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CARUSO, JA .

ANALYTICAL CHEMISTRY, 1984, 56 (12) :2014-2019

[9] AN INTERNALLY TUNED TM010 MICROWAVE RESONANT CAVITY FOR MODERATE POWER MICROWAVE-INDUCED PLASMAS [J].

HAAS, DL ;

CARNAHAN, JW ;

CARUSO, JA .

APPLIED SPECTROSCOPY, 1983, 37 (01) :82-85

[10] INDUCTIVELY COUPLED ARGON PLASMA AS AN ION-SOURCE FOR MASS-SPECTROMETRIC DETERMINATION OF TRACE-ELEMENTS [J].

HOUK, RS ;

FASSEL, VA ;

FLESCH, GD ;

SVEC, HJ ;

GRAY, AL ;

TAYLOR, CE .

ANALYTICAL CHEMISTRY, 1980, 52 (14) :2283-2289

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