ATOMIC LAYER ETCHING OF GAAS(110) WITH BR-2 STUDIED BY SCANNING TUNNELING MICROSCOPY

被引:24
作者
PATRIN, JC
LI, YZ
CHANDER, M
WEAVER, JH
机构
[1] Department of Materials Science and Chemical Engineering, University of Minnesota, Minneapolis
关键词
D O I
10.1063/1.108706
中图分类号
O59 [应用物理学];
学科分类号
摘要
Scanning tunneling microscopy studies of GaAs(110) exposed to Br2 at 720 K show preferential etching at single-height [112BAR] and [001] steps with little etching at double-height steps. Etching in the [110BAR] direction is at least approximately 4.5 times faster than in the [001] direction, producing rectangular etch pits. For higher Br2 exposures, etching is dominated by single-height step flow but triangular double-layer etch pits also form on extended terraces.
引用
收藏
页码:1277 / 1279
页数:3
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