2 SIMPLE METHODS FOR THE MEASUREMENT OF THE DIELECTRIC PERMITTIVITY OF LOW-LOSS MICROSTRIP SUBSTRATES

被引：16

作者：

PANNELL, RM ^{[1
]}

JERVIS, BW ^{[1
]}

机构：

[1] PLYMOUTH POLYTECH,DEPT COMMUN ENGN,PLYMOUTH PL4 8AA,DEVONSHIRE,ENGLAND

来源：

IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES | 1981年 / 29卷 / 04期

关键词：

D O I：

10.1109/TMTT.1981.1130362

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：383 / 386

页数：4

共 11 条

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[7] SIMPLE TECHNIQUE FOR ACCURATE DETERMINATION OF MICROWAVE DIELECTRIC CONSTANT FOR MICROWAVE INTEGRATED CIRCUIT SUBSTRATES [J].

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HUGHES, JJ .

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[8]

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