DIRECT FORCE MEASUREMENT IN SCANNING TUNNELING MICROSCOPY

被引：35

作者：

TANG, SL ^{[1
]}

BOKOR, J ^{[1
]}

STORZ, RH ^{[1
]}

机构：

[1] AT&T BELL LABS,HOLMDEL,NJ 07733

来源：

APPLIED PHYSICS LETTERS | 1988年 / 52卷 / 03期

关键词：

D O I：

10.1063/1.99515

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：188 / 190

页数：3

共 13 条

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[3] ATOMIC RESOLUTION WITH ATOMIC FORCE MICROSCOPE [J].

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[4]

COLEMAN GM, 1958, C METHODS MECHANICAL, P69

[5] EXPERIMENTAL-OBSERVATION OF FORCES ACTING DURING SCANNING TUNNELING MICROSCOPY [J].

DURIG, U ;

GIMZEWSKI, JK ;

POHL, DW .

PHYSICAL REVIEW LETTERS, 1986, 57 (19) :2403-2406

[6] CONTAMINATION-MEDIATED DEFORMATION OF GRAPHITE BY THE SCANNING TUNNELING MICROSCOPE [J].

MAMIN, HJ ;

GANZ, E ;

ABRAHAM, DW ;

THOMSON, RE ;

CLARKE, J .

PHYSICAL REVIEW B, 1986, 34 (12) :9015-9018

[7] MAGNETIC IMAGING BY FORCE MICROSCOPY WITH 1000-A RESOLUTION [J].

MARTIN, Y ;

WICKRAMASINGHE, HK .

APPLIED PHYSICS LETTERS, 1987, 50 (20) :1455-1457

[8] ATOMIC FORCE MICROSCOPE FORCE MAPPING AND PROFILING ON A SUB 100-A SCALE [J].

MARTIN, Y ;

WILLIAMS, CC ;

WICKRAMASINGHE, HK .

JOURNAL OF APPLIED PHYSICS, 1987, 61 (10) :4723-4729

[9]

MCCLELLAND GM, 1987, REV PROGR QUANTITA B, V6, P1307

[10] ATOMIC CORRUGATION OF KISH GRAPHITE IN AIR MEASURED WITH SCANNING TUNNELING MICROSCOPE [J].

MORITA, S ;

TSUKADA, S ;

MIKOSHIBA, N .

JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 1987, 26 (04) :L306-L308

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