LATERAL SURFACE-POTENTIAL DISTRIBUTION OF A PHOSPHOLIPID MONOLAYER

[1] ADAMSON AW, 1982, PHYSICAL CHEM SURFAC

[2] ANDELMAN D, 1985, CR ACAD SCI II, V301, P675

[3] ANDELMANN D, 1987, J PHYS CHEM-US, V686, P3673

[4] THE EFFECTS OF MONOLAYERS ON THE EVAPORATION OF LIQUIDS [J]. ADVANCES IN COLLOID AND INTERFACE SCIENCE, 1986, 25 (02) : 89 - 200

[5] MICRO KELVIN PROBE FOR LOCAL WORK-FUNCTION MEASUREMENTS [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1988, 59 (05) : 802 - 805

[6] OZONE CLEANING OF THE SI-SIO2 SYSTEM [J]. APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1987, 43 (03): : 223 - 226

[7] BAUMGARTNER H, 1988, THESIS U BUNDESWEHR

[8] THE DISTRIBUTION OF IONS UNDER A CHARGED MONOLAYER, AND A SURFACE EQUATION OF STATE FOR CHARGED FILMS [J]. PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL AND PHYSICAL SCIENCES, 1951, 208 (1093): : 224 - 247

[9] DORN WH, 1985, THESIS TORONTO

[10] FISCHER A, 1984, J PHYS LETT-PARIS, V45, pL785

[1] ADAMSON AW, 1982, PHYSICAL CHEM SURFAC

[2] ANDELMAN D, 1985, CR ACAD SCI II, V301, P675

[3] ANDELMANN D, 1987, J PHYS CHEM-US, V686, P3673

[4] THE EFFECTS OF MONOLAYERS ON THE EVAPORATION OF LIQUIDS [J]. ADVANCES IN COLLOID AND INTERFACE SCIENCE, 1986, 25 (02) : 89 - 200

[5] MICRO KELVIN PROBE FOR LOCAL WORK-FUNCTION MEASUREMENTS [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1988, 59 (05) : 802 - 805

[6] OZONE CLEANING OF THE SI-SIO2 SYSTEM [J]. APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1987, 43 (03): : 223 - 226

[7] BAUMGARTNER H, 1988, THESIS U BUNDESWEHR

[8] THE DISTRIBUTION OF IONS UNDER A CHARGED MONOLAYER, AND A SURFACE EQUATION OF STATE FOR CHARGED FILMS [J]. PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL AND PHYSICAL SCIENCES, 1951, 208 (1093): : 224 - 247

[9] DORN WH, 1985, THESIS TORONTO

[10] FISCHER A, 1984, J PHYS LETT-PARIS, V45, pL785