INELASTIC ELECTRON-TUNNELING SPECTROMETER FOR COMPLETE CALIBRATED MEASUREMENTS OF ANY 2 OR 4 TERMINAL JUNCTIONS

被引:9
作者
GAUVIN, S
LEBLANC, RM
机构
[1] Centre de Recherche en Photobiophysique, Université du Québec à Trois-Rivières, Trois-Rivières, Que. G9A 5H7
关键词
D O I
10.1063/1.1143003
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
The conventional tunneling spectrometer gives the uncalibrated second derivative d2V/dI2 versus applied voltage (V) of the junction current-voltage curve (I-V). However, the calibrated second derivative d2I/dV2 is more useful for accurate comparison with theory and can be applied to negative resistance devices. We report here a single electronic instrument for calibrated measurements of all relevant tunneling junction parameters, i.e., dynamic conductance (G), dynamic capacitance (C), current-voltage curve, and its first and second calibrated derivatives. Moreover, it can measure the derivative of the dynamic capacitance (dC/dV) versus applied potential, which is useful for various types of semiconductor devices. This design is versatile enough to find many laboratory applications where current-voltage curves are of interest. The circuit, based on a simple design, is accurate to 1% and allows spectral acquisition in about 15 min.
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页码:149 / 156
页数:8
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