The structure of silica glass by X-ray diffraction studies

被引：234

作者：

Warren, BE ^{[1
]}

Biscoe, J ^{[1
]}

机构：

[1] Massachusetts Inst Technol, Eastman Lab Phys, Cambridge, MA USA

来源：

关键词：

D O I：

10.1111/j.1151-2916.1938.tb15742.x

中图分类号：

TQ174 [陶瓷工业]; TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

引用

页码：49 / 54

页数：6

相关论文

共 5 条

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[2] Ouartz as a devitrification product of vitreous silica
Trostel, LJ
[J]. JOURNAL OF THE AMERICAN CERAMIC SOCIETY, 1936, 19 : 271 - 275
[3] Valenkov N, 1936, Z KRISTALLOGR, V95, P195
[4] Fourier analysis of X-ray patterns of vitreous SiO2 and B(2)O3
Warren, BE
Krutter, H
Morningstar, O
[J]. JOURNAL OF THE AMERICAN CERAMIC SOCIETY, 1936, 19 : 202 - 206
[5] WARREN BE, 1936, PHYS REV, V49, P885