ELECTRICAL, SEM, AND TEM STUDIES IN ZNTE .1. IMPURITY SEGREGATION DURING SHORT ANNEALINGS AND QUENCHING

被引:19
作者
BENSAHEL, D [1 ]
DUPUY, M [1 ]
PFISTER, JC [1 ]
机构
[1] CEN,DIV CRISTALLOGENESE & RECH MAT,ELECTR & TECHNOL INFORMAT LAB,F-38041 GRENOBLE,FRANCE
来源
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH | 1979年 / 55卷 / 01期
关键词
D O I
10.1002/pssa.2210550124
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The lithium behaviour, responsible for one of the two dominant acceptor levels in the II—VI compound ZnTe is investigated. Lithium, a residual impurity, is contained in Te inclusions in as‐grown crystals. After short thermal anneals and quenching, lithium is released from the inclusions and acts as LiZn ≡ “b” acceptor at 61 meV. Its distribution changes across the sample thickness. The main effects are: a variation of the doping level observed by electrical and optical measurements, a large variation in the contrasts observed in SEM in the cathodoluminescence mode, and effects associated with quenching and annealing atmosphere observed in TEM. Copyright © 1979 WILEY‐VCH Verlag GmbH & Co. KGaA
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页码:211 / 221
页数:11
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