OPTICAL-TRANSITIONS IN BI12SIO20

[1] ABRAHAMS C, 1967, J CHEM PHYS, V47, P4037

[2] AGASIEV AA, 1972, FIZ TEKH POLUPROV, V6, P649

[3] BAIRAMOV BK, 1972, FIZ TVERD TELA+, V14, P1711

[4] TRANSPORT PROCESSES OF PHOTOINDUCED CARRIERS IN BI12SIO20 [J]. JOURNAL OF APPLIED PHYSICS, 1973, 44 (06) : 2652 - 2658

[5] POCKELS READOUT OPTICAL MEMORY USING BI12SIO20 [J]. APPLIED PHYSICS LETTERS, 1971, 18 (08) : 325 - &

[6] REAL-TIME DOUBLE-EXPOSURE INTERFEROMETRY WITH BI12SIO20 CRYSTALS IN TRANSVERSE ELECTROOPTIC CONFIGURATION [J]. APPLIED OPTICS, 1977, 16 (07): : 1807 - 1809

[7] PHOTOLUMINESCENCE IN BI12SIO20 AND BI12GEO20 [J]. APPLIED PHYSICS LETTERS, 1970, 17 (04) : 178 - &

[8] IMAGING CHARACTERISTICS OF ITEK PROM [J]. APPLIED OPTICS, 1974, 13 (09): : 2052 - 2060

[9] MAGOMEDOV Z, THESIS I CRYSTALLOGR

[10] Zeinally A.Kh., 1974, FIZ TEKH POLUPROV, V8, P197

[1] ABRAHAMS C, 1967, J CHEM PHYS, V47, P4037

[2] AGASIEV AA, 1972, FIZ TEKH POLUPROV, V6, P649

[3] BAIRAMOV BK, 1972, FIZ TVERD TELA+, V14, P1711

[4] TRANSPORT PROCESSES OF PHOTOINDUCED CARRIERS IN BI12SIO20 [J]. JOURNAL OF APPLIED PHYSICS, 1973, 44 (06) : 2652 - 2658

[5] POCKELS READOUT OPTICAL MEMORY USING BI12SIO20 [J]. APPLIED PHYSICS LETTERS, 1971, 18 (08) : 325 - &

[6] REAL-TIME DOUBLE-EXPOSURE INTERFEROMETRY WITH BI12SIO20 CRYSTALS IN TRANSVERSE ELECTROOPTIC CONFIGURATION [J]. APPLIED OPTICS, 1977, 16 (07): : 1807 - 1809

[7] PHOTOLUMINESCENCE IN BI12SIO20 AND BI12GEO20 [J]. APPLIED PHYSICS LETTERS, 1970, 17 (04) : 178 - &

[8] IMAGING CHARACTERISTICS OF ITEK PROM [J]. APPLIED OPTICS, 1974, 13 (09): : 2052 - 2060

[9] MAGOMEDOV Z, THESIS I CRYSTALLOGR

[10] Zeinally A.Kh., 1974, FIZ TEKH POLUPROV, V8, P197