PHOTOEMISSION IN BRAGG-DIFFRACTION OF X-RAYS BY BICRYSTALS

被引：12

作者：

SOZONTOV, EA

KRUGLOV, MV

ZAKHAROV, BG

机构：

来源：

PHYSICA STATUS SOLIDI A-APPLIED RESEARCH | 1981年 / 66卷 / 01期

关键词：

D O I：

10.1002/pssa.2210660137

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：303 / 310

页数：8

共 14 条

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[9] DETECTION OF ATOMIC PLANE DISPLACEMENTS IN NEAR-SURFACE LAYERS OF CRYSTALS USING ANGULAR-DEPENDENCE OF PHOTOEMISSION DURING BRAGG-DIFFRACTION OF X-RAYS [J].

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[10]

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