NEW APPLICATIONS OF X-RAY STANDING-WAVE FIELDS TO SOLID-STATE PHYSICS

[1] ELECTRON-DISTRIBUTION IN SILICON .1. EXPERIMENT [J]. PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL AND PHYSICAL SCIENCES, 1973, 332 (1589) : 223 - +

[2] DETECTION OF FOREIGN ATOM SITES BY THEIR X-RAY FLUORESCENCE SCATTERING [J]. PHYSICAL REVIEW LETTERS, 1969, 22 (14) : 703 - +

[3] EFFECT OF DYNAMICAL DIFFRACTION IN X-RAY FLUORESCENCE SCATTERING [J]. PHYSICAL REVIEW A-GENERAL PHYSICS, 1964, 133 (3A): : A759 - &

[4] ANOMALOUS DISPERSION CORRECTION DELTAF' FOR NICKEL CLOSE TO K-ABSORPTION EDGE [J]. ZEITSCHRIFT FUR PHYSIK, 1972, 253 (03): : 232 - &

[5] OBSERVATION OF INTERNAL X-RAY WAVE FIELDS DURING BRAGG-DIFFRACTION WITH AN APPLICATION TO IMPURITY LATTICE LOCATION [J]. PHYSICAL REVIEW B, 1974, 10 (10) : 4239 - 4243

[6] KALSEN L, 1976, THESIS AARHUS U

[7] LAUE MV, 1935, ANN PHYS-LEIPZIG, V23, P705

[8] RENNINGER M, 1961, Z NATURFORSCH PT A, V16, P1110

[9] RODIN TN, 1975, PHYS TODAY, V28, P23

[10] RODIN TN, 1976, TREATISE SOLID STATE, V6, pCH5

[1] ELECTRON-DISTRIBUTION IN SILICON .1. EXPERIMENT [J]. PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL AND PHYSICAL SCIENCES, 1973, 332 (1589) : 223 - +

[2] DETECTION OF FOREIGN ATOM SITES BY THEIR X-RAY FLUORESCENCE SCATTERING [J]. PHYSICAL REVIEW LETTERS, 1969, 22 (14) : 703 - +

[3] EFFECT OF DYNAMICAL DIFFRACTION IN X-RAY FLUORESCENCE SCATTERING [J]. PHYSICAL REVIEW A-GENERAL PHYSICS, 1964, 133 (3A): : A759 - &

[4] ANOMALOUS DISPERSION CORRECTION DELTAF' FOR NICKEL CLOSE TO K-ABSORPTION EDGE [J]. ZEITSCHRIFT FUR PHYSIK, 1972, 253 (03): : 232 - &

[5] OBSERVATION OF INTERNAL X-RAY WAVE FIELDS DURING BRAGG-DIFFRACTION WITH AN APPLICATION TO IMPURITY LATTICE LOCATION [J]. PHYSICAL REVIEW B, 1974, 10 (10) : 4239 - 4243

[6] KALSEN L, 1976, THESIS AARHUS U

[7] LAUE MV, 1935, ANN PHYS-LEIPZIG, V23, P705

[8] RENNINGER M, 1961, Z NATURFORSCH PT A, V16, P1110

[9] RODIN TN, 1975, PHYS TODAY, V28, P23

[10] RODIN TN, 1976, TREATISE SOLID STATE, V6, pCH5