TIME-RESOLVED NEAR-FIELD SCANNING OPTICAL MICROSCOPY

被引：10

作者：

BOHM, C

BANGERT, J

MERTIN, W

KUBALEK, E

机构：

[1] Gerhard-Mercator-Universität, GH Duisburg, Fachgebiet Werkstoffe der Elektrotechnik, Duisburg, D 47048

来源：

JOURNAL OF PHYSICS D-APPLIED PHYSICS | 1994年 / 27卷 / 10期

关键词：

D O I：

10.1088/0022-3727/27/10/038

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

The applicability of a near-field scanning optical microscope (NSOM) to measure ultrafast phenomena is experimentally demonstrated. For this application a commercial NSOM is combined with a picosecond laser sampling system. The ability of this time resolved NSOM to perform function and failure analysis of microwave devices is demonstrated. Measurements of high speed electric signals up to 7.5 GHz via the direct electro-optic sampling technique are performed.

引用

页码：2237 / 2240

页数：4

共 7 条

[1] COMBINED SHEAR FORCE AND NEAR-FIELD SCANNING OPTICAL MICROSCOPY [J].