COMBINED SHEAR FORCE AND NEAR-FIELD SCANNING OPTICAL MICROSCOPY

被引：844

作者：

BETZIG, E

FINN, PL

WEINER, JS

机构：

[1] AT and T Bell Laboratories, Murray Hill, NJ 07974

来源：

APPLIED PHYSICS LETTERS | 1992年 / 60卷 / 20期

关键词：

D O I：

10.1063/1.106940

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

A distance regulation method has been developed to enhance the the reliability, versatility, and ease of use of near-field scanning optical microscopy (NSOM). The method relies on the detection of shear forces between the end of a near-field probe and the sample of interest. The system can be used solely for distance regulation in NSOM, for simultaneous shear force and near-field imaging, or for shear force microscopy alone. In the latter case, uncoated optical fiber probes are found to yield images with consistently high resolution.

引用

页码：2484 / 2486

页数：3

共 17 条

[1] BREAKING THE DIFFRACTION BARRIER - OPTICAL MICROSCOPY ON A NANOMETRIC SCALE [J].