SCANNED-TIP REFLECTION-MODE NEAR-FIELD SCANNING OPTICAL MICROSCOPY

Super-resolution near-field scanning optical microscopy is demonstrated in reflection mode with a scanned tip probe. Using visible illumination, opaque samples with features as small as 60 nm are imaged. The interaction of the incident illumination with the probe-sample system is also explored. Detected intensity versus probe-sample separation plots are presented and compared to a model of traveling waves on the sample surface modulated by the optical cavity resulting between the probe and sample. An optical resonance peak detected near the surface will provide a new means of optical feedback, which could be used to accurately determine surface topography.