OBSERVATION OF SINGLE-PARTICLE PLASMONS BY NEAR-FIELD OPTICAL MICROSCOPY

被引：283

作者：

FISCHER, UC

POHL, DW

机构：

[1] IBM CORP,FAC RES,ZURICH RES LAB,CH-8803 RUSCHLIKON,SWITZERLAND

[2] ERNST LEITZ GMBH,D-6330 WETZLAR,FED REP GER

来源：

PHYSICAL REVIEW LETTERS | 1989年 / 62卷 / 04期

关键词：

D O I：

10.1103/PhysRevLett.62.458

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

引用

页码：458 / 461

页数：4

共 18 条

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[8] NEAR-FIELD OPTICAL-SCANNING MICROSCOPY IN REFLECTION [J].

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APPLIED PHYSICS LETTERS, 1986, 49 (11) :674-676

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