NEAR-FIELD OPTICAL-SCANNING MICROSCOPY IN REFLECTION

被引：96

作者：

FISCHER, UC ^{[1
]}

DURIG, UT ^{[1
]}

POHL, DW ^{[1
]}

机构：

[1] IBM RES,ZURICH RES LAB,CH-8803 RUSCHLIKON,SWITZERLAND

来源：

APPLIED PHYSICS LETTERS | 1988年 / 52卷 / 04期

关键词：

D O I：

10.1063/1.99483

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

收藏

页码：249 / 251

页数：3

相关论文

共 13 条

[1] SUPER-RESOLUTION APERTURE SCANNING MICROSCOPE
ASH, EA
NICHOLLS, G
[J]. NATURE, 1972, 237 (5357) : 510 - &
[2] ATOMIC FORCE MICROSCOPE
BINNIG, G
QUATE, CF
GERBER, C
[J]. PHYSICAL REVIEW LETTERS, 1986, 56 (09) : 930 - 933
[3] NATURAL LITHOGRAPHY
DECKMAN, HW
DUNSMUIR, JH
[J]. APPLIED PHYSICS LETTERS, 1982, 41 (04) : 377 - 379
[4] NEAR-FIELD OPTICAL-SCANNING MICROSCOPY
DURIG, U
POHL, DW
ROHNER, F
[J]. JOURNAL OF APPLIED PHYSICS, 1986, 59 (10) : 3318 - 3327
[5] OPTICAL CHARACTERISTICS OF 0.1-MU-M CIRCULAR APERTURES IN A METAL-FILM AS LIGHT-SOURCES FOR SCANNING ULTRAMICROSCOPY
FISCHER, UC
[J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1985, 3 (01): : 386 - 390
[6] SUB-MICROSCOPIC PATTERN REPLICATION WITH VISIBLE-LIGHT
FISCHER, UC
ZINGSHEIM, HP
[J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1981, 19 (04): : 881 - 885
[7] SUBMICROMETER APERTURE IN A THIN METAL-FILM AS A PROBE OF ITS MICROENVIRONMENT THROUGH ENHANCED LIGHT-SCATTERING AND FLUORESCENCE
FISCHER, UC
[J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA B-OPTICAL PHYSICS, 1986, 3 (10) : 1239 - 1244
[8] FISCHER UC, 1987, SCAN MICROSC S, V1, P47
[9] SUPERRESOLUTION FLUORESCENCE NEAR-FIELD SCANNING OPTICAL MICROSCOPY
HAROOTUNIAN, A
BETZIG, E
ISAACSON, M
LEWIS, A
[J]. APPLIED PHYSICS LETTERS, 1986, 49 (11) : 674 - 676
[10] Israelachvili JN., 1985, INTERMOLECULAR SURFA