SPECTROSCOPY OF SEMICONDUCTOR INVERSION LAYERS IN HIGH MAGNETIC-FIELDS

被引:5
作者
KOTTHAUS, JP [1 ]
机构
[1] TECH UNIV MUNICH,DEPT PHYS,D-8046 GARCHING,FED REP GER
关键词
D O I
10.1016/0304-8853(79)90226-9
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Inversion layers on semiconductors are nearly ideal systems to investigate the electronic properties of a two-dimensional electron gas (2DEG). With infrared spectroscopy several resonance excitations of the 2DEG are studied, such as intersubband resonance, cyclotron resonance, combined resonances, electron-spin resonance, and plasmons. Selected results of such investigations and their implications for the electronic properties of the 2DEG are reviewed with special emphasis on high magnetic field experiments. The discussion is centered around the characteristically different semiconductors Si, InSb and PbTe. © 1979.
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页码:20 / 25
页数:6
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