ELECTROOPTIC PROBING OF MMIC DEVICES WITH A SEMICONDUCTOR-LASER USING A NOVEL METHOD FOR PHASE REFERENCING

被引：3

作者：

HARVEY, GT ^{[1
]}

HEUTMAKER, MS ^{[1
]}

COOK, TB ^{[1
]}

PERINO, JS ^{[1
]}

机构：

[1] AT&T BELL LABS,HOLMDEL,NJ 07733

来源：

IEEE PHOTONICS TECHNOLOGY LETTERS | 1991年 / 3卷 / 06期

关键词：

D O I：

10.1109/68.91039

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

We measure both the phase and amplitude frequency response of GaAs MMIC's (monolithic microwave integrated circuits) over a range of 2 to 18 GHz using electrooptic sampling with a gain-switched semiconductor laser. A novel phase-referencing technique allows accurate frequency scans of the phase response by eliminating problems associated with phase changes between the synthesizers driving the circuit and the laser. Using coated optics and differential detection, we have achieved a voltage resolution of 0.5 mV / square-root Hz, within 4 dB of our shot-noise limit.

引用

页码：573 / 575

页数：3

共 7 条

[1]

Majidi-Ahy R., 1989, IEEE 1989 MTT-S International Microwave Symposium Digest (Cat. No.89CH2725-0), P299, DOI 10.1109/MWSYM.1989.38722

[2]

Robins W. P., 1984, PHASE NOISE SIGNAL S

[3] SUBPICOSECOND LASER TIMING STABILIZATION [J].