共 11 条
- [2] ANALYSIS OF SOLIDS BY SECONDARY ION AND SPUTTERED NEUTRAL MASS-SPECTROMETRY [J]. APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1985, 37 (04): : 211 - 220
- [3] QUANTITATIVE-ANALYSIS OF HE IN SOLIDS BY SPUTTERED NEUTRAL MASS-SPECTROMETRY [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 1987, 5 (04): : 1194 - 1197
- [4] KORNELSEN EV, 1974, P INT C APPLICATIONS
- [5] PROBES FOR EDGE PLASMA STUDIES OF TFTR [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1986, 57 (08) : 2107 - 2112
- [7] SADLER G, 1989, JET P8977 PREPR
- [8] SARTORI R, 1990, J NUCL MATER, V176
- [9] SATHERBLOM HE, 1986, NUCL INSTRUM METH A, V52, P107
- [10] Zuhr R. A., 1984, Nuclear Science Applications, Section B, V1, P617