MEASUREMENT OF SUB-MICRON LASER-BEAM RADII

被引：91

作者：

SCHNEIDER, MB ^{[1
]}

WEBB, WW ^{[1
]}

机构：

[1] CORNELL UNIV, SCH APPL & ENGN PHYS, ITHACA, NY 14853 USA

来源：

APPLIED OPTICS | 1981年 / 20卷 / 08期

关键词：

D O I：

10.1364/AO.20.001382

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

引用

收藏

页码：1382 / 1388

页数：7

相关论文

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