COMPARISON OF THE NIST HIGH-ACCURACY CRYOGENIC RADIOMETER AND THE NIST SCALE OF DETECTOR SPECTRAL RESPONSE

Two independent methods of measurement were used to determine the absolute spectral responsivity and external quantum efficiency of light-trapping silicon photodiode packages. These trap packages were calibrated first by the NIST High Accuracy Cryogenic Radiometer at laser wavelengths of 633 nm and 442 nm. They were also measured in the NIST Spectral Comparator Facility with working standards traceable to a 100 % quantum efficient radiometer (QED-200). The two sets of measurements agree to better than 0,1 % at 633 nm and 0.25 % at 442 nm.