共 13 条
[1]
FISCHETTI MV, 1991, IEEE T ELECTRON DEV, V38, P6550
[2]
GLEMBOCKI OJ, IN PRESS MATER RES S
[4]
DIFFERENT FERMI-LEVEL PINNING BEHAVIOR ON N-TYPE AND P-TYPE GAAS(001)
[J].
PHYSICAL REVIEW B,
1993, 48 (07)
:4612-4615
[5]
CONTACTLESS ELECTROMODULATION INVESTIGATIONS OF SURFACE-INTERFACE ELECTRIC-FIELDS IN SEMICONDUCTOR MICROSTRUCTURES
[J].
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B,
1993, 11 (04)
:1710-1716
[7]
UNIFIED DEFECT MODEL AND BEYOND
[J].
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY,
1980, 17 (05)
:1019-1027
[8]
TOMKIEWICZ M, 1977, J ELECTROCHEM SOC, V124, P1436, DOI 10.1149/1.2133669
[10]
THE CONTINUING DRAMA OF THE SEMICONDUCTOR INTERFACE
[J].
PHILOSOPHICAL TRANSACTIONS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL PHYSICAL AND ENGINEERING SCIENCES,
1993, 344 (1673)
:521-532