DIRECT MEASUREMENT OF SPECTRAL EMISSIVITY OF LIQUID SI IN THE RANGE OF VISIBLE-LIGHT

被引:15
作者
TAKASUKA, E
TOKIZAKI, E
TERASHIMA, K
KIMURA, S
机构
[1] ERATO, Ibaraki
关键词
D O I
10.1063/1.114650
中图分类号
O59 [应用物理学];
学科分类号
摘要
A spectral emissivity of liquid Si is measured by a direct measurement of thermal radiations to get a clear information on the spectral emissivity. The spectral emissivity was gained directly from a measurement of thermal radiation from a surface of Si melt and a blackbody radiation for the continuous wavelength range of visible light. Temperature dependence of such spectral emissivities was also investigated.
引用
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页码:152 / 154
页数:3
相关论文
共 5 条
[1]  
[Anonymous], 1990, BINARY ALLOY PHASE D
[2]   MEASUREMENTS OF THE OPTICAL-PROPERTIES OF LIQUID SILICON AND GERMANIUM USING NANOSECOND TIME-RESOLVED ELLIPSOMETRY [J].
JELLISON, GE ;
LOWNDES, DH .
APPLIED PHYSICS LETTERS, 1987, 51 (05) :352-354
[3]  
KRISHNAN S, 1990, HIGH TEMP SCI, V30, P137
[4]  
SHVAREV KM, 1975, FIZ TVERD TELA, V16, P2111
[5]  
Sparrow EM., 1962, J HEAT TRANSFER, V84, P73, DOI [10.1115/1.3684295, DOI 10.1115/1.3684295]