MEASUREMENTS OF THE OPTICAL-PROPERTIES OF LIQUID SILICON AND GERMANIUM USING NANOSECOND TIME-RESOLVED ELLIPSOMETRY

被引：129

作者：

JELLISON, GE

LOWNDES, DH

机构：

来源：

关键词：

D O I：

10.1063/1.98438

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：352 / 354

页数：3

共 9 条

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[2] THE OPTICAL PROPERTIES OF LIQUID GERMANIUM, TIN AND LEAD
HODGSON, JN
[J]. PHILOSOPHICAL MAGAZINE, 1961, 6 (64): : 509 - 515
[3] TIME-RESOLVED ELLIPSOMETRY
JELLISON, GE
LOWNDES, DH
[J]. APPLIED OPTICS, 1985, 24 (18): : 2948 - 2955
[4] TIME-RESOLVED REFLECTIVITY MEASUREMENTS ON SILICON AND GERMANIUM USING A PULSED EXCIMER KRF LASER-HEATING BEAM
JELLISON, GE
LOWNDES, DH
MASHBURN, DN
WOOD, RF
[J]. PHYSICAL REVIEW B, 1986, 34 (04): : 2407 - 2415
[5] TIME-RESOLVED ELLIPSOMETRY MEASUREMENTS OF THE OPTICAL-PROPERTIES OF SILICON DURING PULSED EXCIMER LASER IRRADIATION
JELLISON, GE
LOWNDES, DH
[J]. APPLIED PHYSICS LETTERS, 1985, 47 (07) : 718 - 721
[6] LI KD, 1986, SOLID STATE COMMUN, V61, P207
[7] Shvarev K. M., 1975, Soviet Physics - Solid State, V16, P2111
[8] SHVAREV KM, 1977, HIGH TEMP+, V15, P548
[9] Wood R. F., 1984, SEMICONDUCTORS SEMIM, V23