TIME-RESOLVED ELLIPSOMETRY

被引:33
作者
JELLISON, GE
LOWNDES, DH
机构
来源
APPLIED OPTICS | 1985年 / 24卷 / 18期
关键词
D O I
10.1364/AO.24.002948
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
引用
收藏
页码:2948 / 2955
页数:8
相关论文
共 22 条
[1]   PHOTOELECTRIC ANALYSIS OF ELLIPTICALLY POLARIZED LIGHT [J].
ARCHARD, JF ;
CLEGG, PL ;
TAYLOR, AM .
PROCEEDINGS OF THE PHYSICAL SOCIETY OF LONDON SECTION B, 1952, 65 (394) :758-768
[2]   HIGH PRECISION SCANNING ELLIPSOMETER [J].
ASPNES, DE ;
STUDNA, AA .
APPLIED OPTICS, 1975, 14 (01) :220-228
[3]   PICOSECOND ELLIPSOMETRY OF TRANSIENT ELECTRON-HOLE PLASMAS IN GERMANIUM [J].
AUSTON, DH ;
SHANK, CV .
PHYSICAL REVIEW LETTERS, 1974, 32 (20) :1120-1123
[4]   TIME-RESOLVED REFLECTIVITY OF ION-IMPLANTED SILICON DURING LASER ANNEALING [J].
AUSTON, DH ;
SURKO, CM ;
VENKATESAN, TNC ;
SLUSHER, RE ;
GOLOVCHENKO, JA .
APPLIED PHYSICS LETTERS, 1978, 33 (05) :437-440
[5]  
Azzam RMA, 1977, ELLIPSOMETRY POLARIZ
[6]  
Clarke D., 1971, POLARIZED LIGHT OPTI
[8]  
EISENTHAL KB, 1982, PICOSECOND PHENOMENA, V3
[9]   EFFECTS OF COMPONENT IMPERFECTIONS ON ELLIPSOMETER CALIBRATION [J].
HUNTER, WR .
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1973, 63 (08) :951-957
[10]   AN IMPROVED METHOD FOR HIGH REFLECTIVITY ELLIPSOMETRY BASED ON A NEW POLARIZATION MODULATION TECHNIQUE [J].
JASPERSON, SN ;
SCHNATTERLY, SE .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1969, 40 (06) :761-+