TIME-RESOLVED REFLECTIVITY MEASUREMENTS ON SILICON AND GERMANIUM USING A PULSED EXCIMER KRF LASER-HEATING BEAM

被引：148

作者：

JELLISON, GE

LOWNDES, DH

MASHBURN, DN

WOOD, RF

机构：

来源：

PHYSICAL REVIEW B | 1986年 / 34卷 / 04期

关键词：

D O I：

10.1103/PhysRevB.34.2407

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：2407 / 2415

页数：9

共 30 条

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