THOMAS-FERMI DIELECTRIC SCREENING IN SEMICONDUCTORS

被引：249

作者：

RESTA, R

机构：

[1] UNIV PISA,IST FIS,I-56100 PISA,ITALY

[2] CNR,GRP NAZL STRUTT MAT,I-56100 PISA,ITALY

来源：

PHYSICAL REVIEW B | 1977年 / 16卷 / 06期

关键词：

D O I：

10.1103/PhysRevB.16.2717

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：2717 / 2722

页数：6

共 33 条

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