HIGH-RESOLUTION GRATINGS FOR THE SOFT-X-RAY

被引：20

作者：

HETTRICK, MC ^{[1
]}

机构：

[1] UNIV CALIF BERKELEY LAWRENCE BERKELEY LAB,CTR XRAY OPT,BERKELEY,CA 94720

来源：

关键词：

D O I：

10.1016/0168-9002(88)90420-2

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：404 / 413

页数：10

共 15 条

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HETTRICK, MC
[J]. APPLIED OPTICS, 1984, 23 (18): : 3221 - 3235
[7] EXTREME ULTRAVIOLET EXPLORER SPECTROMETER
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[8] HETTRICK MC, 1985, P SOC PHOTO OPT INST, V597, P291
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